Please use this identifier to cite or link to this item:
http://thuvienso.bvu.edu.vn/handle/TVDHBRVT/18764| Title: | Scanning Electron Microscopy and X-Ray Microanalysis |
| Authors: | Joseph I. Goldstein Dale E. Newbury Joseph R. Michael Nicholas W.M. Ritchie John Henry J. Scott David C. Joy |
| Issue Date: | 2018 |
| Publisher: | Springer |
| URI: | http://thuvienso.bvu.edu.vn/handle/TVDHBRVT/18764 |
| ISBN: | 978-1-4939-6676-9 |
| Appears in Collections: | Multi-Discipline |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 978-1-4939-6676-9.pdf | 66,74 MB | Adobe PDF |  Sign in to read |
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