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Title: Scanning Electron Microscopy and X-Ray Microanalysis
Authors: Joseph I. Goldstein
Dale E. Newbury
Joseph R. Michael
Nicholas W.M. Ritchie
John Henry J. Scott
David C. Joy
Issue Date: 2018
Publisher: Springer
ISBN: 978-1-4939-6676-9
Appears in Collections:Multi-Discipline

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